Abstract : Avanadium pentoxide (V2O5) thin-film is deposited on to a platinum substrate using an electrostatic spray deposition (ESD) technique andits performance in a secondary lithium cell is reported for the first time. The deposited thin-film is characterized in terms of structure andsurface morphology using X-ray diffraction (XRD) and scanning electron microscopy (SEM), respectively. The XRD studies reveals that thestructure of the thin V2O5 film is amorphous. The crystallinity increases with rise in the annealing temperature from 200 to 275 8C and iscomposed of orthorhombic V2O5 crystals. Scanning electron micrographs indicate the near-porous nature of the annealed thin-film. The electrochemical behavior of the thin-film of vanadate is investigated by means of cyclic voltammetry (CV) and galvanostatic discharge
